Conveniently Measure Dielectric Properties

“MCK is an easy to use test bench due to its hardware and software. It drives the VNA from a computer through Ethernet (no need administrator privileges) and allows saving time with no need of classical s2p calibration on cables. The measurements are repeatable and the included calliper simplifies the work.”

“Seven different types of low-loss dielectric materials were measured using such an MCK operating at 50-75 GHz, and the extracted dielectric constant and loss tangent values show good agreement with values published in the open literature.[…] A new method based on MCK is an attractive alternative approach to the conventional free-space technique, for material characterization at millimeter-wave and terahertz frequencies.”